Montgomery, Paul C.
Serio, Bruno
Anstotz, Freddy
Montaner, Denis
This article is maintained by: Elsevier
Article Title: Far field optical nanoscopy: How far can you go in nanometric characterization without resolving all the details?
Journal Title: Applied Surface Science
CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.apsusc.2013.02.029
Content Type: article
Copyright: Copyright © 2013 Elsevier B.V. All rights reserved.